@misc{indiciae7223ab2536a3,
  title = {SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering},
  author = {MinJin Hwang and Bappaditya Dey and Enrique Dehaerne and Sandip Halder and Young-han Shin},
  year = {2023},
  doi = {10.1117/12.2657555},
  url = {https://arxiv.org/abs/2302.09569},
  note = {Source identifier: 2302.09569}
}