@misc{indiciae4ef0d0f3b764,
  title = {TransferD2: Automated Defect Detection Approach in Smart Manufacturing using Transfer Learning Techniques},
  author = {Atah Nuh Mih and Hung Cao and Joshua Pickard and Monica Wachowicz and Rickey Dubay},
  year = {2023},
  url = {https://arxiv.org/abs/2302.13317},
  note = {Source identifier: 2302.13317}
}