TY  - RPRT
TI  - Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations
AU  - Nirjhar Sarkar
AU  - Prabhakar R. Bandaru
AU  - Robert C. Dynes
PY  - 2023
UR  - https://arxiv.org/abs/2303.03712
ID  - 2303.03712
ER  -