TY  - RPRT
TI  - Characteristic time of transition from write error to retention error in voltage-controlled magnetoresistive random-access memory
AU  - Hiroko Arai
AU  - Hiroshi Imamura
PY  - 2023
DO  - 10.1016/j.jmmm.2023.170624
UR  - https://arxiv.org/abs/2303.05706
ID  - 2303.05706
ER  -