TY  - RPRT
TI  - Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin Probe Force Microscopy
AU  - Luca Fabbri
AU  - Camilla Bordoni
AU  - Pedro Barquinha
AU  - Jerome Crocco
AU  - Beatrice Fraboni
AU  - Tobias Cramer
PY  - 2023
DO  - 10.1063/5.0151367
UR  - https://arxiv.org/abs/2303.08442
ID  - 2303.08442
ER  -