TY  - RPRT
TI  - Boron-related defects in n-type 4H-SiC Schottky barrier diodes
AU  - Tihomir Knežević
AU  - Eva Jelavić
AU  - Yuichi Yamazaki
AU  - Takeshi Ohshima
AU  - Takahiro Makino
AU  - Ivana Capan
PY  - 2023
DO  - 10.3390/ma16093347
UR  - https://arxiv.org/abs/2303.09810
ID  - 2303.09810
ER  -