TY  - RPRT
TI  - A Novel Patent Similarity Measurement Methodology: Semantic Distance and Technological Distance
AU  - Yongmin Yoo
AU  - Cheonkam Jeong
AU  - Sanguk Gim
AU  - Junwon Lee
AU  - Zachary Schimke
AU  - Deaho Seo
PY  - 2023
UR  - https://arxiv.org/abs/2303.16767
ID  - 2303.16767
ER  -