@misc{indiciae7174c2248ffd,
  title = {Measurement of Dielectric Loss in Silicon Nitride at Centimeter and Millimeter Wavelengths},
  author = {Z. Pan and P. S. Barry and T. Cecil and C. Albert and A. N. Bender and C. L. Chang and R. Gualtieri and J. Hood and J. Li and J. Zhang and M. Lisovenko and V. Novosad and G. Wang and V. Yefremenko},
  year = {2023},
  doi = {10.1109/tasc.2023.3264953},
  url = {https://arxiv.org/abs/2304.01103},
  note = {Source identifier: 2304.01103}
}