TY  - RPRT
TI  - Crack-free high composition (>35%) thick (>30 nm) barrier AlGaN/AlN/GaN HEMT on sapphire with record low sheet resistance
AU  - Swarnav Mukhopadhyay
AU  - Cheng Liu
AU  - Jiahao Chen
AU  - Surjava Sanyal
AU  - Ruixin Bai
AU  - Guangying Wang
AU  - Chirag Gupta
AU  - Shubhra Pasayat
PY  - 2024
DO  - 10.3390/cryst13101456
UR  - https://arxiv.org/abs/2304.05593
ID  - 2304.05593
ER  -