TY  - RPRT
TI  - Capacitance characterization of Graphene/n-Si Schottky junction solar cell with MOS capacitor
AU  - Masahiro Teraoka
AU  - Yuzuki Ono
AU  - Hojun Im
PY  - 2023
DO  - 10.1088/2053-1591/acf09c
UR  - https://arxiv.org/abs/2304.06320
ID  - 2304.06320
ER  -