TY  - RPRT
TI  - Calibrated Microwave Reflectance in Low-Temperature Scanning Tunneling Microscopy
AU  - Bareld Wit
AU  - Georg Gramse
AU  - Stefan Müllegger
PY  - 2023
UR  - https://arxiv.org/abs/2304.08331
ID  - 2304.08331
ER  -