@misc{indiciae93a0c584e0a6,
  title = {Lattice deformation at the sub-micron scale: X-ray nanobeam measurements of elastic strain in electron shuttling devices},
  author = {C. Corley-Wiciak and M. H. Zoellner and I. Zaitsev and K. Anand and E. Zatterin and Y. Yamamoto and A. A. Corley-Wiciak and F. Reichmann and W. Langheinrich and L. R. Schreiber and C. L. Manganelli and M. Virgilio and C. Richter and G. Capellini},
  year = {2023},
  doi = {10.1103/physrevapplied.20.024056},
  url = {https://arxiv.org/abs/2304.09120},
  note = {Source identifier: 2304.09120}
}