@misc{indiciaea87caef7bd9d,
  title = {Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits},
  author = {Pranjal Dutta and Prateek Dwivedi and Nitin Saxena},
  year = {2023},
  doi = {10.4230/lipics.ccc.2021.11},
  url = {https://arxiv.org/abs/2304.11325},
  note = {Source identifier: 2304.11325}
}