TY  - RPRT
TI  - Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits
AU  - Pranjal Dutta
AU  - Prateek Dwivedi
AU  - Nitin Saxena
PY  - 2023
DO  - 10.4230/lipics.ccc.2021.11
UR  - https://arxiv.org/abs/2304.11325
ID  - 2304.11325
ER  -