TY  - RPRT
TI  - Temperature Measurement on Copper Surfaces for Superconducting Thin Film Cavity Applications
AU  - Antonio Bianchi
AU  - Giovanna Vandoni
AU  - Walter Venturini Delsolaro
PY  - 2023
UR  - https://arxiv.org/abs/2304.14229
ID  - 2304.14229
ER  -