@misc{indiciae9d7c50909885,
  title = {Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization},
  author = {Alexander E. Siemenn and Eunice Aissi and Fang Sheng and Armi Tiihonen and Hamide Kavak and Basita Das and Tonio Buonassisi},
  year = {2023},
  doi = {10.1038/s41467-024-48768-2},
  url = {https://arxiv.org/abs/2304.14408},
  note = {Source identifier: 2304.14408}
}