TY  - RPRT
TI  - Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization
AU  - Alexander E. Siemenn
AU  - Eunice Aissi
AU  - Fang Sheng
AU  - Armi Tiihonen
AU  - Hamide Kavak
AU  - Basita Das
AU  - Tonio Buonassisi
PY  - 2023
DO  - 10.1038/s41467-024-48768-2
UR  - https://arxiv.org/abs/2304.14408
ID  - 2304.14408
ER  -