@misc{indiciaecbc1d1d56ef2,
  title = {A method to determine the M2 beam quality from the electric field in a single plane},
  author = {M. H. Griessmann and A. C. Martinez-Becerril and J. S. Lundeen},
  year = {2023},
  doi = {10.1364/optcon.494610},
  url = {https://arxiv.org/abs/2305.07724},
  note = {Source identifier: 2305.07724}
}