@misc{indiciae1a2727de8e1c,
  title = {Quantifying the effect of X-ray scattering for data generation in real-time defect detection},
  author = {Vladyslav Andriiashen and Robert van Liere and Tristan van Leeuwen and K. Joost Batenburg},
  year = {2024},
  doi = {10.3233/xst-230389},
  url = {https://arxiv.org/abs/2305.12822},
  note = {Source identifier: 2305.12822}
}