TY  - RPRT
TI  - Quantifying the effect of X-ray scattering for data generation in real-time defect detection
AU  - Vladyslav Andriiashen
AU  - Robert van Liere
AU  - Tristan van Leeuwen
AU  - K. Joost Batenburg
PY  - 2024
DO  - 10.3233/xst-230389
UR  - https://arxiv.org/abs/2305.12822
ID  - 2305.12822
ER  -