@misc{indiciaee561f473d190,
  title = {Modeling of Surface Damage at the Si/SiO\$\_2\$-interface of Irradiated MOS-capacitors},
  author = {N. Akchurin and G. Altopp and B. Burkle and W. D. Frey and U. Heintz and N. Hinton and M. Hoeferkamp and Y. Kazhykarim and V. Kuryatkov and T. Mengke and T. Peltola and S. Seidel and E. Spencer and M. Tripathi and J. Voelker},
  year = {2023},
  doi = {10.1088/1748-0221/18/08/p08001},
  url = {https://arxiv.org/abs/2305.14316},
  note = {Source identifier: 2305.14316}
}