TY  - RPRT
TI  - Wavelength-stepping algorithm for testing thickness, front and back surfaces of optical plates with high signal-to-noise ratio
AU  - Manuel Servin
AU  - Gonzalo Paez
AU  - Moises Padilla
AU  - Guillermo Garnica
PY  - 2023
DO  - 10.1364/josaa.495465
UR  - https://arxiv.org/abs/2306.01082
ID  - 2306.01082
ER  -