@misc{indiciae9322d31322c6,
  title = {Detection and modeling of hole capture by single point defects under variable electric fields},
  author = {Artur Lozovoi and YunHeng Chen and Gyorgy Vizkelethy and Edward Bielejec and Johannes Flick and Marcus W. Doherty and Carlos A. Meriles},
  year = {2023},
  doi = {10.1021/acs.nanolett.3c00860},
  url = {https://arxiv.org/abs/2306.01572},
  note = {Source identifier: 2306.01572}
}