TY  - RPRT
TI  - Detection and modeling of hole capture by single point defects under variable electric fields
AU  - Artur Lozovoi
AU  - YunHeng Chen
AU  - Gyorgy Vizkelethy
AU  - Edward Bielejec
AU  - Johannes Flick
AU  - Marcus W. Doherty
AU  - Carlos A. Meriles
PY  - 2023
DO  - 10.1021/acs.nanolett.3c00860
UR  - https://arxiv.org/abs/2306.01572
ID  - 2306.01572
ER  -