TY  - RPRT
TI  - Transferable Machine Learning Approach for Predicting Electronic Structures of Charged Defects
AU  - Yuxing Ma
AU  - Yang Zhong
AU  - Yu Hongyu
AU  - Shiyou Chen
AU  - Hongjun Xiang
PY  - 2023
UR  - https://arxiv.org/abs/2306.08017
ID  - 2306.08017
ER  -