@misc{indiciaefa109202f8e2,
  title = {Radiation-Induced Degradation Mechanism of X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure},
  author = {Kouichi Hagino and Masatoshi Kitajima and Takayoshi Kohmura and Ikuo Kurachi and Takeshi G. Tsuru and Masataka Yukumoto and Ayaki Takeda and Koji Mori and Yusuke Nishioka and Takaaki Tanaka},
  year = {2023},
  doi = {10.1109/tns.2023.3287130},
  url = {https://arxiv.org/abs/2306.08716},
  note = {Source identifier: 2306.08716}
}