TY  - RPRT
TI  - Radiation-Induced Degradation Mechanism of X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure
AU  - Kouichi Hagino
AU  - Masatoshi Kitajima
AU  - Takayoshi Kohmura
AU  - Ikuo Kurachi
AU  - Takeshi G. Tsuru
AU  - Masataka Yukumoto
AU  - Ayaki Takeda
AU  - Koji Mori
AU  - Yusuke Nishioka
AU  - Takaaki Tanaka
PY  - 2023
DO  - 10.1109/tns.2023.3287130
UR  - https://arxiv.org/abs/2306.08716
ID  - 2306.08716
ER  -