@misc{indiciaee2e7a3ca6cad,
  title = {Exploring the Relationship between Samples and Masks for Robust Defect Localization},
  author = {Jiang Lin and Yaping Yan},
  year = {2023},
  url = {https://arxiv.org/abs/2306.10720},
  note = {Source identifier: 2306.10720}
}