@misc{indiciae0b3d417281ae,
  title = {Defect Localization in Flip-Chip Devices Using Space-Domain Reflectometry and Magnetic Current Imaging},
  author = {David Noel},
  year = {2023},
  url = {https://arxiv.org/abs/2306.11209},
  note = {Source identifier: 2306.11209}
}