TY  - RPRT
TI  - Nanometer displacement measurement based on metrological self-mixing grating interferometer traceable to the pitch standard of one-dimension chromium self-traceable grating
AU  - Zhenjie Gu
AU  - Zhangning Xie
AU  - Zhikun Chang
AU  - Guangxu Xiao
AU  - Zhijun Yin
AU  - Zichao Lin
AU  - Tong Zhou
AU  - Lihua Lei
AU  - Tao Jin
AU  - Dongbai Xue
AU  - Xiao Deng
AU  - Xinbin Chen
AU  - Tongbao Li
PY  - 2023
UR  - https://arxiv.org/abs/2306.14146
ID  - 2306.14146
ER  -