TY  - RPRT
TI  - Delving into Crispness: Guided Label Refinement for Crisp Edge Detection
AU  - Yunfan Ye
AU  - Renjiao Yi
AU  - Zhirui Gao
AU  - Zhiping Cai
AU  - Kai Xu
PY  - 2023
DO  - 10.1109/tip.2023.3289296
UR  - https://arxiv.org/abs/2306.15172
ID  - 2306.15172
ER  -