@misc{indiciae91d749a46926,
  title = {Polarimetric iToF: Measuring High-Fidelity Depth through Scattering Media},
  author = {Daniel S. Jeon and Andreas Meuleman and Seung-Hwan Baek and Min H. Kim},
  year = {2023},
  url = {https://arxiv.org/abs/2306.17618},
  note = {Source identifier: 2306.17618}
}