TY  - RPRT
TI  - Polarimetric iToF: Measuring High-Fidelity Depth through Scattering Media
AU  - Daniel S. Jeon
AU  - Andreas Meuleman
AU  - Seung-Hwan Baek
AU  - Min H. Kim
PY  - 2023
UR  - https://arxiv.org/abs/2306.17618
ID  - 2306.17618
ER  -