TY  - RPRT
TI  - Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis
AU  - Xander M. de Wit
AU  - Amelia W. Paine
AU  - Caroline Martin
AU  - Aaron M. Goldfain
AU  - Rees F. Garmann
AU  - Vinothan N. Manoharan
PY  - 2023
DO  - 10.1364/ao.499389
UR  - https://arxiv.org/abs/2307.01730
ID  - 2307.01730
ER  -