@misc{indiciae4bad50a997c9,
  title = {Quantum metrology in the finite-sample regime},
  author = {Johannes Jakob Meyer and Sumeet Khatri and Daniel Stilck França and Jens Eisert and Philippe Faist},
  year = {2023},
  doi = {10.1103/qbn1-p6bq},
  url = {https://arxiv.org/abs/2307.06370},
  note = {Source identifier: 2307.06370}
}