@misc{indiciae797c5fdd3a7f,
  title = {Parameter extraction of Extended Floating Gate Field Effect Transistors (EGFETs): Estimating the threshold voltage, series resistance, and mobility degradation from I-V measurements},
  author = {Yunsoo Park and Santosh Pandey},
  year = {2023},
  url = {https://arxiv.org/abs/2307.11101},
  note = {Source identifier: 2307.11101}
}