TY  - RPRT
TI  - Parameter extraction of Extended Floating Gate Field Effect Transistors (EGFETs): Estimating the threshold voltage, series resistance, and mobility degradation from I-V measurements
AU  - Yunsoo Park
AU  - Santosh Pandey
PY  - 2023
UR  - https://arxiv.org/abs/2307.11101
ID  - 2307.11101
ER  -