TY  - RPRT
TI  - In-Situ Thickness Measurement of Die Silicon Using Voltage Imaging for Hardware Assurance
AU  - Olivia P. Dizon-Paradis
AU  - Nitin Varshney
AU  - M Tanjidur Rahman
AU  - Michael Strizich
AU  - Haoting Shen
AU  - Navid Asadizanjani
PY  - 2023
UR  - https://arxiv.org/abs/2307.13118
ID  - 2307.13118
ER  -