TY  - RPRT
TI  - Tracking defects of Electronic Crystals by Coherent X-ray Diffraction
AU  - David Le Bolloc'h
AU  - E. Bellec
AU  - N. Kirova
AU  - V. L. R. Jacques
PY  - 2023
DO  - 10.3390/sym15071449
UR  - https://arxiv.org/abs/2307.13536
ID  - 2307.13536
ER  -