TY  - RPRT
TI  - Field-Emission Resonances in Thin Metallic Films: Nonexponential Decay of the Tunneling Current as a Function of the Sample-to-Tip Distance
AU  - A. Yu. Aladyshkin
AU  - K. Schouteden
PY  - 2023
DO  - 10.1021/acs.jpcc.2c02374
UR  - https://arxiv.org/abs/2308.00418
ID  - 2308.00418
ER  -