TY  - RPRT
TI  - Polarization sensitivity in scattering-type scanning near-field optical microscopy -- towards nanoellipsometry
AU  - Felix G. Kaps
AU  - Susanne C. Kehr
AU  - Lukas M. Eng
PY  - 2023
UR  - https://arxiv.org/abs/2308.06023
ID  - 2308.06023
ER  -