@misc{indiciaed6b820e1c8b2,
  title = {SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection},
  author = {Vic De Ridder and Bappaditya Dey and Enrique Dehaerne and Sandip Halder and Stefan De Gendt and Bartel Van Waeyenberge},
  year = {2023},
  url = {https://arxiv.org/abs/2308.07180},
  note = {Source identifier: 2308.07180}
}