TY  - RPRT
TI  - SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection
AU  - Vic De Ridder
AU  - Bappaditya Dey
AU  - Enrique Dehaerne
AU  - Sandip Halder
AU  - Stefan De Gendt
AU  - Bartel Van Waeyenberge
PY  - 2023
UR  - https://arxiv.org/abs/2308.07180
ID  - 2308.07180
ER  -