@misc{indiciae29604422c58d,
  title = {An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns},
  author = {Tae Yeob Kang and Haebom Lee and Sungho Suh},
  year = {2024},
  url = {https://arxiv.org/abs/2308.11639},
  note = {Source identifier: 2308.11639}
}