TY  - RPRT
TI  - An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns
AU  - Tae Yeob Kang
AU  - Haebom Lee
AU  - Sungho Suh
PY  - 2024
UR  - https://arxiv.org/abs/2308.11639
ID  - 2308.11639
ER  -