TY  - RPRT
TI  - Distinguishing the importance of different charge trapping centers in CaF2-based 2D material MOSFETs
AU  - Zhe Zhao
AU  - Tao Xiong
AU  - Jian Gong
AU  - Yue-Yang Liu
PY  - 2023
UR  - https://arxiv.org/abs/2309.06152
ID  - 2309.06152
ER  -