TY  - RPRT
TI  - Inflection Phenomenon in Cryogenic MOSFET Behavior
AU  - Arnout Beckers
AU  - Farzan Jazaeri
AU  - Christian Enz
PY  - 2023
DO  - 10.1109/ted.2020.2965475
UR  - https://arxiv.org/abs/2309.13667
ID  - 2309.13667
ER  -