@misc{indiciae05f099c055bb,
  title = {Impact of interface traps on charge noise, mobility and percolation density in Ge/SiGe heterostructures},
  author = {L. Massai and B. Hetényi and M. Mergenthaler and F. J. Schupp and L. Sommer and S. Paredes and S. W. Bedell and P. Harvey-Collard and G. Salis and A. Fuhrer and N. W. Hendrickx},
  year = {2023},
  doi = {10.1038/s43246-024-00563-8},
  url = {https://arxiv.org/abs/2310.05902},
  note = {Source identifier: 2310.05902}
}