@misc{indiciae3e995cb6b8a1,
  title = {A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs},
  author = {Christopher A. Grome and Wei Ji},
  year = {2023},
  doi = {10.3390/electronics13081414},
  url = {https://arxiv.org/abs/2310.06184},
  note = {Source identifier: 2310.06184}
}