TY  - RPRT
TI  - A Brief Review of Single Event Burnout Failure Mechanisms and Design Tolerances of Silicon Carbide MOSFETs
AU  - Christopher A. Grome
AU  - Wei Ji
PY  - 2023
DO  - 10.3390/electronics13081414
UR  - https://arxiv.org/abs/2310.06184
ID  - 2310.06184
ER  -